High-Speed Semiconductor Particle Size Laser Analyzer

• Customization: Available
• Sample Feeding: Wet Dispersion
• Warranty: 1 Year
• Model NO.: BHY-1076
• Sample Concentration: 0.5‰-1%
• Scanning Speed: 2,000 Times Per Second
• Repeatability Error: ≦1%
• Testing Range: 0.1μm-500μm
• Transport Package: Carton Packaging
• Trademark: BSIT
• Origin: Made in China
• HS Code: 9031809090
• Production Capacity: 7 Sets/Week

Product Description

Product Description

Wet Method Laser Particle Size Analyzer BHY-1076

The BHY-1076 is an integrated opto-mechanical-electrical-computer system utilizing an imported semiconductor laser (635nm, 3mW) with superior monochromaticity and 25,000-hour lifespan. With advanced mechanical design, microelectronic circuitry, high-sensitivity photodetector arrays, and Mie scattering theory-based algorithms, it delivers precise and rapid analysis for cost-effective particle sizing.

Specification

Key Features

BHY-300 Recirculating Sampler (Optional)
- Integrated ultrasonic dispersion, circulation, stirring with timer control.
- Peristaltic pump prevents sample contamination.
- Dual cells: Micro Cell (organic solvents) & Circulating Cell (aqueous media)

Powerful Software System

-Integrated computer analysis software for data processing.
-Printer outputs test reports.

Integrated Optical Path Structure
- Inverse Fourier optics + monolithic housing (zero realignment needed).
- Streamlined design for ergonomic maintenance.
- EMI shielding ensures electrical stability.

75° Wide-Angle Detector Array
- 71-element main array (21.5° detection).
- 5-element lateral array (75° detection, non-uniform cross-arrangement).

25,000-Hour Laser Durability
- Semiconductor laser (λ=635nm, 3mW) with industrial-grade lifespan.

H.Golub Inversion Algorithm
- Full Mie scattering theory implementation.
- Accurate for mono-/poly-disperse samples (e.g., powders, emulsions).

Flexible Report Formats
- Customizable templates for distribution tables, curves, histograms, and key metrics (e.g., span, uniformity).

ISO 13320-1:2020 Compliance
-Meets ISO 13320-1 international standard.
-Validated with national standard reference materials.

Parameter	Specification	Notes
Measurement Range	0.1 μm – 500 μm	(100nm to 500μm, no sub-100nm claim)
Light Source	Semiconductor Laser	λ=635nm, P=3mW, Lifespan>25,000 hours
Method	Wet Method Only	Dry method not supported
Sample Concentration	0.5‰ – 1%	Density/Particle Size/RI dependent
Test Time	<1 minute/test	Excludes sample dispersion time
Scanning Speed	2,000 scans/second
Repeatability Error	≤1%
Power Supply	220V±10%, 50/60Hz, 80W
Computer Interface	RS-232 Serial Port
OS Compatibility	Windows All Versions

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