Wide Angle Submicron Laser Analyzer for Particle Size

• Customization: Available
• Sample Feeding: Wet Dispersion
• Warranty: 1 Year
• Model NO.: BHY-1080
• Sample Concentration: 0.5‰-1%
• Scanning Speed: 2,000 Times Per Second
• Repeatability Error: ≤1%
• Testing Range: 0.1μm-500μm
• Transport Package: Carton Packaging
• Trademark: BSIT
• Origin: Made in China
• HS Code: 9031809090
• Production Capacity: 7 Sets/Week

Product Description

Product Description

Wide Angle Submicron Laser Analyzer For Particle Size

The BHY-1080 Laser Particle Size Analyzer represents a new-generation instrument featuring a measurement range extending down to 40 nanometers. Its optical system incorporates a 71-cell main photodetector array with a detection angle of 21.5°, complemented by a non-uniform cross-arranged side/backward photodetector array with 9 cells at 135°.

The instrument integrates an advanced reverse Fourier optical design with a unique monolithic optical path structure, ensuring exceptional long-term stability without the need for realignment. Precision mechanical engineering and streamlined design result in a compact, robust, and ergonomic instrument that facilitates both operation and maintenance.

Enhanced electromagnetic shielding and interference suppression technologies guarantee stable electrical performance, delivering highly accurate and reproducible results.

Specification

Key Features

BHY-300 Recirculating Sampler (Optional)

Integrated ultrasonic dispersion, circulation, stirring with timer.
Peristaltic pump prevents sample contamination.
Dual cells: Micro Cell (organic solvents) & Circulating Cell (aqueous media), switchable without replacement.
Advanced Software System

Dedicated computer analysis software for data processing.
Printer-compatible test report output.
Integrated Optical Path Technology

Optimized inverse Fourier optical design with monolithic structure (no realignment needed).
Streamlined mechanical design for compact layout and ergonomic maintenance.
EMI/RFI shielding ensures electrical stability.
135° Wide-Angle Detector Array

71-element main detector array (21.5° forward detection).
9-element lateral/backscatter array in non-uniform cross-arrangement (135° backscatter detection).
25,000-Hour Laser Durability

Semiconductor laser (λ=635nm, 3mW) with extended lifespan.
H.Golub Inversion Algorithm

Full Mie scattering theory implementation for mono-/poly-disperse samples.
Customizable Report Formats

Exportable cumulative/interval distribution data, curves, histograms, and key metrics (D10/D50/D90).
ISO 13320-1:2020 Compliance

Validated with certified reference materials.

Parameter	Specification
Measurement Range	0.04μm (40nm) – 500μm
Light Source	Semiconductor Laser (635nm, 3mW)
Sample Method	Wet Method Only
Sample Concentration	0.5‰ – 1%
Test Time	<1 minute/test (excl. dispersion)
Scanning Speed	2,000 scans/second
Repeatability Error	≤1%
Power Supply	220V±10%, 50/60Hz, 80W
Computer Interface	RS-232 Serial Port (PC-controlled)
Operating System	Windows All Versions
Detector Configuration	71+9 photodetector array
Max Detection Angle	135° backscatter

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